Design & Testing of Tcam Faults Using T
نویسندگان
چکیده
Ternary content addressable memory (TCAM) is one key component in high-performance networking applications. An asymmetric TCAM cell consists of a binary content addressable memory (BCAM) bit and a mask bit. In this paper, we analyze comparison faults of the asymmetric TCAM cell based on BCAM comparison faults. Then march-like test algorithms T are proposed to cover the comparison faults of the comparison H circuits in TCAMs with asymmetric cells. The test algorithm T requires 7N Write operations and (3N+2B) H Compare operations to cover the comparison faults of an N × B bit TCAM with Hit output only; and the TPAE test algorithm requires 4N Write operations and (3N+2B) Compare operations to cover the comparison faults of an N × B bit TCAM with priority address encoder (PAE) output.
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